A MULTI-BIT ERROR-TOLERANT SRAM-BASED TCAM FOR ADVANCED NETWORK PERFORMANCE

Abstract

Ternary content addressable memory (TCAM) is utilized for rapid data access. In the realm of TCAM production, ASICs have always been regarded as the benchmark of excellence. Nonetheless, a field-programmable gate array (FPGA) is employed in the fabrication of SRAM-based TCAMs. Data continues to be supplied through Content-Addressable Memory (CAM) notwithstanding the ambiguity around its precise location and identity. Binary is the most used CAM format due to its exclusive use of the digits 0 and 1. Ternary content-addressable memory (TCAM) is, in comparison, more intricate than content-addressable memory (CAM). Bit-wise storing of any value is indeed feasible. The implementation of FPGA technology in accelerated tasks entails the potential for minor errors. These deficiencies heighten the probability that this method will fail to yield the intended outcomes. This is due to the fact that SRAM-based TCAMs occasionally struggle to effectively seek for and rectify minor mistakes. Contemporary technology simplifies the error detection process by using a single parity bit for each word. This technique enables the detection and correction of single-bit errors. The proposed method emphasizes the importance of multiple bit upsets (MBUs) to enhance the MBU diagnosis and repair processes. Row, column, and diagonal parity may be beneficial for detecting multi-bit errors. Individuals are often cared to on a one-on-one basis. Errors are promptly rectified to maintain the efficacy of the search process.